Work

Electrostatic forces in atomic force microscopy

Year: 2002

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.66.035402

Authors: B. M. Law, F. Rieutord

Institutions: Kansas State University, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2048523958

FWCI: 1.63

Cites: 18

Cited by: 123

Related to: 10