A comparison of carrier lifetime measurements by photoconductive decay and surface photovoltage methods
Year: 1978
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.325149
Authors: T. L. Chu, E. D. Stokes
Institution: Southern Methodist University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2051642736