Work

Thermal Diffusivity of Film/Substrate Structures Characterized by Transient Thermal Grating Method

Year: 2008

Type: article

Abstract: Transient thermal grating method is used to measure the thermal diffusivity of absorbing films deposited on transparent substrates. According to periodically modulated dielectric constant variations and thermoelastic deformations of the thin films caused by the transient thermal gratings, an improved optical diffraction theory is presented. In the experiment, the probing laser beam reflectively diffracted by the thermal grating is measured by a photomultiplier at different grating fringe spaces. The thermal diffusivity of the film can be evaluated by fitting the theoretical calculations of diffraction signals to the experimental measured data. The validity of the method is tested by measuring the thermal diffusivities of absorbing ZnO films deposited on glass substrates.

Source: Chinese Physics Letters

DOI: 10.1088/0256-307x/25/1/048

Authors: Xu Xiao-Dong, Ma Di, Zhang Shu-Yi, Luo Ai-Hua, Kiyotaka Wasa

Institutions: Nanjing University, Kyoto University

Language: English

Topic: Thermography and Photoacoustic Techniques

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

Funder: National Natural Science Foundation of China

Award: 脉冲光声热波方法研究功能材料