Year: 2007
Type: article
Abstract: The epitaxial growth and formation mechanism of the partially La- and Nd-substituted perovskite structures, and the ferroelectric properties of bismuth lanthanoid nickel titanate [(Bi 1- x La x )(Ni 0.5 Ti 0.5 )O 3 ; BLNT and (Bi 1- x Nd x )(Ni 0.5 Ti 0.5 )O 3 ; BNNT] based solid solution films deposited on Pt(100)/MgO(100) substrates by rf sputtering have been investigated using X-ray diffraction, transmission electron microscope, and polarization–electric field hysteresis loop measurements. BLNT samples at x ≥0.3 and BNNT samples at x ≥0.4 were confirmed to have a single-phase perovskite structure. This small difference is speculated that it is related to metal–oxygen bond dissociation energy. The sample substituted with La exhibited the best hysteresis loop at x = 0.5 with a remanent polarization of P r = 12 µC/cm 2 and the sample substituted by Nd exhibited the best hysteresis loop at x = 0.4 with a remanent polarization of P r = 2 µC/cm 2 .
DOI: 10.1143/jjap.46.6938
Institutions: University of Hyogo, Japan Atomic Energy Agency, Fujitsu (Japan)
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2052007128