Work

How knowledge about speckle intensity and phase gradients can improve electronic speckle pattern interferometry

Year: 1999

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.355083

Authors: Heinz Helmers, Jan Burke

Institution: Carl von Ossietzky Universität Oldenburg

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2052223158

FWCI:

Cites: 1

Cited by: 1

Related to: 10