Fourier transform spectrometer for spectral emissivity measurement in the temperature range between 60 and 1500°C
Year: 2005
Type: conference-paper
Abstract: A new spectral emissivity measurement system has been developed at Harbin Institute of Technology (HIT) by using a Fourier transform infrared (FTIR) spectrometer. The spectral range between 0.6 and 25 µm was covered by a photovoltaic HgCdTe and a silicon photodiode detector. A SiC heater with a black hole was employed for heating the sample. The temperature of the sample can be controlled in a range between 60 and 1500°C with an error of less than 1°C. The system was calibrated against two high quality reference blackbodies: a low temperature heat-pipe blackbody operated in the temperature range between 60°C and 300°C and a high temperature blackbody with SiC heater operated in the temperature range between 300°C and 1500°C. Several tests were done for this new system. The estimated uncertainty of emissivity measurement is better than 3%.
Authors: Jingmin Dai, Xinbei Wang, Guibin Yuan
Institution: Harbin Institute of Technology
Language: English
Subfield: Aerospace Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W2052389552