Damage Detection in Cryogenic Composites for Space Applications Using Piezoelectric Wafer Active Sensors
Year: 2008
Type: conference-paper
DOI: 10.2514/6.2008-1968
Authors: Giola Bottai, Patrick Pollock, Thomas Behling, Victor Giurgiutiu, Scott Bland, Shiv Joshi
Institution: University of South Carolina
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2052499282
