A circuit level variability prediction of basic logic gates in advanced trigate CMOS technology
Year: 2014
Type: conference-paper
Authors: E. R. Hsieh, C. M. Hung, T. Y. Wang, Steve S. Chung, R. M. Huang, C. T. Tsai, T. R. Yew
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2052724080
