Work

Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques

Year: 1996

Type: article

Source: Applied Surface Science

DOI: 10.1016/0169-4332(95)00173-5

Authors: O. Bohnke, G. Frand, M. Fromm, J. Weber, O. Greim

Institutions: Centre National de la Recherche Scientifique, Le Mans Université, Université de Franche-Comté, University of Neuchâtel

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2053501604

FWCI: 1.244

Cites: 15

Cited by: 24

Related to: 10