Work

Endface reflectivities of optical nanowires

Year: 2009

Type: article

Abstract: Endface reflectivities (ERs) of optical nanowires are investigated using three-dimensional finite-difference time-domain simulations. Typical ERs of both free-standing and substrate-supported silica, tellurite, PMMA and semiconductor nanowires or nanofibers are obtained. Unlike in conventional waveguides such as optical fibers, ERs of nanowires are usually considerably lower when operated in single mode. Dependences of ER on the diameter and the refractive index of the nanowire, and the wavelength of the guided light are also investigated. These results are helpful for estimating and understanding ERs in optical nanowires with diameters close to or smaller than the wavelengths of the light, and may offer valuable references for practical applications such as nanowire or nanofiber-based resonators and lasers.

Source: Optics Express

DOI: 10.1364/oe.17.010881

Authors: Shanshan Wang, Zhifang Hu, Huakang Yu, Wei Fang, Min Qiu, Limin Tong

Institutions: State Key Laboratory of Modern Optical Instruments, Zhejiang University, KTH Royal Institute of Technology

Language: English

Topic: Photonic and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $2,270

OpenAlex ID: W2053776334

FWCI: 2.32

Cites: 26

Cited by: 46

Related to: 10