Work

Using Nanoindentation and Nanoscratch to Determine Thin Film Mechanical Properties

Year: 2006

Type: article

Source: Key engineering materials

DOI: 10.4028/www.scientific.net/kem.326-328.357

Authors: Rwei Ching Chang, Feng Yuan Chen, Chang En Sun

Institutions: St. John's University, St. John's University, LeeMing Institute of Technology

Language: English

Topic: Metal and Thin Film Mechanics

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2056084864

FWCI:

Cites: 8

Cited by: 6

Related to: 10