Work

Sensitivity in X-ray grating interferometry on compact systems

Year: 2012

Type: conference-paper

Source: AIP conference proceedings

DOI: 10.1063/1.4742307

Authors: Thomas Thuering, Peter Modregger, Stefan Hämmerle, Stephan Weiss, Joachim Nüesch, Marco Stampanoni

Institutions: Paul Scherrer Institute, ETH Zurich, Institute for Biomedical Engineering, Swiss Light Source, University of Lausanne, Scanco Medical (Switzerland)

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Paul Scherrer Institut

OpenAlex ID: W2056086079

FWCI: 4.676

Cites:

Cited by: 17

Related to: 10