Work

Defect detection in multilayer ceramic capacitors

Year: 2006

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2006.07.082

Authors: V. Krieger, W. Wondrak, A. Dehbi, W. Bartel, Y. Ousten, B. Levrier

Institutions: Université Montpellier 2, Daimler (Germany), Université de Bordeaux

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2056624784

FWCI: 0.328

Cites: 1

Cited by: 18

Related to: 10