Work

The understanding of the bulk trigate MOSFET's reliability through the manipulation of RTN traps

Year: 2013

Type: conference-paper

Source: International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

DOI: 10.1109/vlsi-tsa.2013.6545596

Authors: E. R. Hsieh, P. C. Wu, S. S. Chung, C. H. Tsai, R. M. Huang, C. T. Tsai

Institutions: National Yang Ming Chiao Tung University, United Microelectronics (Taiwan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2059638486

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