Spectroscopic ellipsometry studies of nanocrystalline carbon thin films deposited by HFCVD
Year: 2001
Type: article
Source: Diamond and Related Materials
Authors: S Gupta, B.R Weiner, G Morell
Institution: University of Puerto Rico System
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2060095243
