Work

Effects of random surface roughness in pixe analysis of thick targets

Year: 1985

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/0168-583x(85)90040-0

Authors: J.L. Campbell, R.D. Lamb, R.G. Leigh, B.G. Nickel, J.A. Cookson

Institution: University of Guelph

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2064763592

FWCI: 1.004

Cites: 5

Cited by: 35

Related to: 10