Work

Practical compact modeling approaches and options for sub-0.1 μm CMOS technologies

Year: 2003

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/s0026-2714(02)00278-0

Authors: Mansun Chan, Xuemei Xi, Jin He, Kanyu M. Cao, Mohan V. Dunga, Ali M. Niknejad, Ping K. Ko, Chenming Hu

Institutions: Hong Kong University of Science and Technology, University of California, Berkeley

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2065734941

FWCI: 0.335

Cites: 5

Cited by: 4

Related to: 10