Work

Quantitative strain analysis in AlGaAs-based devices

Year: 2003

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.1579567

Authors: Jens W. Tomm, Axel Gerhardt, Roland Müller, Mark L. Biermann, Joseph P. Holland, Dirk Lorenzen, Eberhard Kaulfersch

Institutions: Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy, United States Naval Academy, Jenoptik (Germany), Angewandte Micro Messtechnik (Germany)

Language: English

Topic: Semiconductor Quantum Structures and Devices

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2069153155

FWCI: 2.537

Cites: 18

Cited by: 28

Related to: 10