On the role of stacking faults on dislocation generation and dislocation cluster formation in multicrystalline silicon
Year: 2012
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.4767062
Institutions: Norwegian University of Science and Technology, SINTEF
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Norges Forskningsråd
OpenAlex ID: W2069676366