Shallow defect density determination in CuIn3Se5 thin film photoabsorber by impedance spectroscopy
Year: 2008
Type: article
Source: Thin Solid Films
Institutions: Tallinn University of Technology, St Petersburg University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Eesti Teadusfondi
OpenAlex ID: W2071084669