Ab Initio Calculations and Measurements of Thermoelectric Properties of V2O5 Films
Year: 2012
Type: article
Abstract: Density functional theory and the Boltzmann transport equation were used to calculate the thermoelectric transport coefficients for bulk V 2 O 5 and MV 2 O 5 (M = Cr, Ti, Na, Li). The structural relaxation for the given compounds based on the ABINIT code was observed. The temperature dependences of the Seebeck coefficients as well as electrical and thermal electrical conductivities of all relaxed structures displayed anisotropic behavior. Electrooptical measurements of thermoelectric properties were carried out on V 2 O 5 thin films obtained by thermal evaporation with different post-annealing treatments. A Seebeck coefficient of −148 μ V/K at T = 300 K was obtained in the in-plane direction for V 2 O 5 thin films with thickness less than 100 nm.
Source: Journal of Electronic Materials
Authors: Yu. Chumakov, S.-Y. Xiong, J. R. Santos, I. Ferreira, K. Termentzidis, A. Pokropivny, P. Cortona, S. Volz
Institutions: Academy of Sciences of Moldova, Centre National de la Recherche Scientifique, École Centrale Paris, Institute of Applied Physics, Laboratoire d'Énergétique Moléculaire et Macroscopique, Combustion, Uninova, Centro de Investigação em Materiais, Universidade Nova de Lisboa, Laboratoire Énergies & Mécanique Théorique et Appliquée, Université de Lorraine, Laboratoire Structures, Propriétés et Modélisation des Solides
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2071165005