Work

Study of tip magnetization behavior in magnetic force microscope

Year: 1991

Type: article

Source: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

DOI: 10.1116/1.585186

Authors: K. Sueoka, K. Okuda, N. Matsubara, F. Sai

Institution: IBM Research - Tokyo

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2072992033

FWCI: 2.905

Cites:

Cited by: 30

Related to: 10