Work

Multireflection grazing incidence diffraction used for stress measurements in surface layers

Year: 2012

Type: article

Source: Thin Solid Films

DOI: 10.1016/j.tsf.2012.05.042

Authors: M. Marciszko, A. Baczmański, M. Wróbel, W. Seiler, C. Braham, J. Donges, M. Śniechowski, K. Wierzbanowski

Institutions: AGH University of Krakow, Arts et Métiers, Deutsches Elektronen-Synchrotron DESY

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2073063643

FWCI: 1.695

Cites: 10

Cited by: 32

Related to: 10