Work

An improved high frequency C-V method for interface state analysis on MIS structures

Year: 1997

Type: article

Source: Solid-State Electronics

DOI: 10.1016/s0038-1101(96)00112-8

Authors: A Koukab, A Bath, E Losson

Institutions: Supélec, Université Paul Verlaine - Metz

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2074577451

FWCI: 3.005

Cites: 9

Cited by: 33

Related to: 10