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Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses

Year: 2007
Type: article
Abstract: Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120fs mode-locked Ti:sapphire laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250fs rms jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities.
DOI: 10.1063/1.2716360
Authors: P. Radcliffe, S. Düsterer, A. Azima, H. Redlin, J. Feldhaus, J. Dardis, K. Kavanagh, H. Luna, J. Pedregosa Gutierrez, P. Yeates, E. T. Kennedy, J. T. Costello, A. Delserieys, C. L. S. Lewis, R. Taïeb, A. Maquet, D. Cubaynes, M. Meyer
Institutions: Deutsches Elektronen-Synchrotron DESY, Dublin City University, Queen's University Belfast, Laboratoire de Chimie Physique - Matière et Rayonnement, Université Pierre-et-Marie-Curie, Centre National de la Recherche Scientifique
Language: English
Open Access status: bronze
OpenAlex ID: W2076190817
FWCI: 4.71
Cites: 14
Cited by: 71
Related to: 10