Work

Photo-Ionization Cross Section Measurements of Deep Levels in Iron Doped GaAs

Year: 1976

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.15.2275

Authors: Kuninori Kitahara, Kenya Nakai, Masashi Ozeki, Akihiro Shibatomi, Koichi Dazai

Institution: Fujitsu (Japan)

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2076872036

FWCI:

Cites:

Cited by: 10

Related to: 10