Work

A generative model for burst error characterization in a fading channel

Year: 2008

Type: conference-paper

Source: IEEE Region 10 Conference (TENCON)

DOI: 10.1109/tencon.2008.4766506

Authors: K. Kandhway, A. Anand, R. Bhattacharjee

Institution: Indian Institute of Technology Guwahati

Language: English

Topic: Advanced Wireless Communication Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2077683085

FWCI:

Cites: 11

Cited by: 3

Related to: 10