Evidence for electrically induced drift of threshold voltage in Ge2Sb2Te5
Year: 2013
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.4811553
Authors: M. Cassinerio, N. Ciocchini, D. Ielmini
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2078041825
