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Z-Scan: A Simple And Sensitive Technique For Nonlinear Refraction Measurements

Year: 1990

Type: conference-paper

Abstract: We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond frequency doubled Nd:YAG laser pulses.

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.962142

Authors: M. Sheik-bahae, A. A. Said, T. H. Wei, Y. Y. Wu, D. J. Hagan, M. J. Soileau, E. W. Van Stryland

Institution: University of Central Florida

Language: English

Topic: Nonlinear Optical Materials Studies

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

Funders: National Science Foundation, Defense Advanced Research Projects Agency

OpenAlex ID: W2078416775

FWCI:

Cites: 20

Cited by: 53

Related to: 10