Optical temperature measurements of silicon microbridge emitters
Year: 2010
Type: article
Source: Applied Optics
DOI: 10.1364/ao.49.001489
Institutions: Aalto University, National metrology institute VTT MIKES
Language: English
Subfield: Aerospace Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2078680261