Work

Design and performance of an ultra-high-resolution 300 kV microscope

Year: 1996

Type: article

Source: Ultramicroscopy

DOI: 10.1016/0304-3991(96)00026-5

Authors: Hans Bakker, Arno Bleeker, Peter Mul

Institution: Philips (Netherlands)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2079166602

FWCI: 0.843

Cites: 9

Cited by: 19

Related to: 10