Work

Effective testing for wafer reject minimization by terahertz analysis and sub-surface imaging

Year: 2014

Type: conference-paper

Source: ASMC proceedings

DOI: 10.1109/asmc.2014.6847013

Authors: Anis Rahman, Aunik K. Rahman

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2080337117

FWCI: 1.204

Cites: 2

Cited by: 6

Related to: 10