Work

Electrical breakdown and ESD phenomena for devices with nanometer-to-micron gaps

Year: 2003

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.478191

Authors: Albert J. Wallash, Larry Levit

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2081908127

FWCI: 8.215

Cites: 3

Cited by: 147

Related to: 10