Work

Resonance ionization mass spectrometry of sputtered osmium and rhenium atoms

Year: 1990

Type: article

Source: Analytical Chemistry

DOI: 10.1021/ac00201a022

Authors: Joel D. Blum, M. J. Pellin, W. F. Calaway, C. E. Young, D. M. Gruen, I. D. Hutcheon, G. J. Wasserburg

Institutions: California Institute of Technology, Argonne National Laboratory

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: California Institute of Technology

OpenAlex ID: W2082201212

FWCI: 7.066

Cites: 8

Cited by: 31

Related to: 10