Year: 1991
Type: article
Authors: YASUNOBU ONISHI, HIROKAZU NIKI, YOSHIHITO KOBAYASHI, RUMIKO HORIGUCHI HAYASE, NAOHIKO OYASATO, OSAMU SASAKI
Institution: Toshiba (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W2086442741
