Work

Influence of native defects on transport properties of Li-doped NiO

Year: 1966

Type: article

Source: Physics Letters

DOI: 10.1016/0031-9163(66)90389-1

Authors: H.J. Van Daal, A.J. Bosman

Institution: Philips (Netherlands)

Language: English

Topic: Electrical and Thermal Properties of Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2086818693

FWCI: 0.775

Cites: 6

Cited by: 6

Related to: 10