Characterization of Insulin Adsorption in the Presence of Albumin by Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy
Year: 2007
Type: article
Source: Langmuir
DOI: 10.1021/la701850p
Authors: M. Henry, C. Dupont-Gillain, P. Bertrand
Institutions: UCLouvain, KU Leuven
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2086862033
