Work

Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers

Year: 2003

Type: article

Source: Optics Communications

DOI: 10.1016/j.optcom.2003.09.050

Authors: Chunmin Zhang, Baochang Zhao, Bin Xiangli, Xinwei Zha

Institutions: Chinese Academy of Sciences, Xi'an Institute of Optics and Precision Mechanics, Xi'an Jiaotong University, Xi’an University of Posts and Telecommunications

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funders: National Science Foundation, National Natural Science Foundation of China, Natural Science Foundation of Shaanxi Province

OpenAlex ID: W2087874799

FWCI: 0.976

Cites: 7

Cited by: 52

Related to: 10