Work

Microphotoreflectance spectroscopy of heterojunction bipolar transistors under biasing voltage: Measurement of the net doping concentration

Year: 2007

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.2751591

Authors: Houssam Chouaib, Catherine Bru-Chevallier

Institutions: Centre National de la Recherche Scientifique, Institut des Nanotechnologies de Lyon, Institut National des Sciences Appliquées de Lyon

Language: English

Topic: Semiconductor Quantum Structures and Devices

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2088033775

FWCI: 0.408

Cites: 14

Cited by: 3

Related to: 10