Energy‐dispersive x‐ray analysis of trace metals in micro amounts of aqueous samples by an ultra‐thin film droplet method
Year: 1999
Type: article
Source: X-Ray Spectrometry
Institution: Seiko Instruments Inc. (Japan)
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2089309595
