Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria
Year: 2005
Type: article
Source: Microelectronics Reliability
Authors: F.J. Garcı́a Sánchez, A. Ortiz-Conde, J. Muci
Institution: Universidad Simón Bolívar
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2089736674