Work

Use of a Monte-Carlo Code to Determine in High Z Semi-Conductor CdTe and CZT, Both Carriers Lifetimes and Mobilities

Year: 1997

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-487-301

Authors: E. Muller, M. Jung, P. Fougfères, M. Hage-Ali, P. Siffert

Institution: Centre National de la Recherche Scientifique

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2090465116

FWCI: 0.962

Cites: 17

Cited by: 7

Related to: 10