Work

Assessment of random and systematic errors in microwave and submillimetre dielectric measurements

Year: 1977

Type: article

Source: Proceedings of the Institution of Electrical Engineers

DOI: 10.1049/piee.1977.0121

Authors: M.N. Afsar, J. Chamberlain, G.W. Chantry, R. Finsy, R. van Loon

Institutions: National Physical Laboratory, Université Libre de Bruxelles, Vrije Universiteit Brussel

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2090857744

FWCI: 2.669

Cites: 17

Cited by: 9

Related to: 10