Work

Drain induced barrier thinning on TFETs with different source/drain engineering

Year: 2014

Type: conference-paper

Source: Symposium on Microelectronics Technology and Devices

DOI: 10.1109/sbmicro.2014.6940092

Authors: Marcio D. V. Martino, Joao A. Martino, Paula G. D. Agopian

Institution: Universidade de São Paulo

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Conselho Nacional de Desenvolvimento Científico e Tecnológico

OpenAlex ID: W2093201872

FWCI: 2.81

Cites: 5

Cited by: 26

Related to: 10