Work

Analysis and Simulation of a Low-Leakage Analog Single Gate and FinFET Circuits

Year: 2014

Type: article

Source: International Journal of Nanoscience

DOI: 10.1142/s0219581x14500124

Authors: Manorama Chauhan, Ravindra Singh Kushwah, Pavan Shrivastava, Shyam Akashe

Institution: ITM University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: ITM University-Gwalior

OpenAlex ID: W2093871014

FWCI: 0.173

Cites: 11

Cited by: 1

Related to: 10