Work

Effective post-silicon failure localization using dynamic program slicing

Year: 2014

Type: article

DOI: 10.5555/2616606.2617064

Authors: Ophir Friedler, Wisam Kadry, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin

Institution: IBM Research - Haifa

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2097994445

FWCI: 3.232

Cites: 21

Cited by: 6

Related to: 10