Work

Effects of various applications on relative lifetime of processor cores

Year: 2009

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/irws.2009.5383013

Authors: T. Gupta, C. Bertolini, O. Heron, N. Ventroux, T. Zimmer, F. Marc

Institutions: Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Laboratoire d'Intégration des Systèmes et des Technologies, Université de Bordeaux, Université Bordeaux-I

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2099451963

FWCI: 1.437

Cites: 13

Cited by: 3

Related to: 10