Low- and high-field electron-transport parameters for unstrained and strained Si/sub 1-x/Ge/sub x/
Year: 1997
Type: article
Source: IEEE Electron Device Letters
DOI: 10.1109/55.585350
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2102166336
