Work

A Statistical Approach to Derive an Electrical Port Model of Capacitively Coupled Interconnects

Year: 2004

Type: article

Source: IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications

DOI: 10.1109/tcsi.2004.823661

Authors: P. Maffezzoni, A. Brambilla

Institution: Politecnico di Milano

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2102995455

FWCI: 0.2

Cites: 27

Cited by: 1

Related to: 10