Work

Validation of the 2 Temperatures Noise Model Using Pre-Matched Transistors in W-Band for Sub-65 nm Technology

Year: 2010

Type: article

Source: IEEE Microwave and Wireless Components Letters

DOI: 10.1109/lmwc.2010.2045588

Authors: Nicolas Waldhoff, Yoann Tagro, Daniel Gloria, Frederic Gianesello, François Danneville, Gilles Dambrine

Institutions: Institut d'Electronique, de Microélectronique et de Nanotechnologie, STMicroelectronics (France)

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2104480974

FWCI: 0.953

Cites: 7

Cited by: 7

Related to: 10